Strategic Investment to Boost Domestic Semiconductor Equipment Development
On November 5th, Raintree Scientific Instruments Corporation (RSIC) completed a strategic funding round, raising nearly 69 million USD. The capital will be focused on improving the domestic replacement capabilities of advanced semiconductor process optical measurement equipment, expanding the product line, and enhancing market development capabilities.

A Leading Player in Semiconductor Measurement Equipment
Founded in 2005, Raintree Scientific Instruments Corporation specializes in optical measurement equipment for semiconductor front-end processes. Its core products include thin-film measurement and dimension optical inspection equipment, among others.
Cutting-edge Defect Detection Solutions
In the area of defect detection, Raintree Scientific Instruments Corporation has launched the FSD, WSD, and BriteSD series of equipment. The WSD series is the first domestic defect detection equipment designed for semiconductor front-end processes with mass production capabilities. Currently, the company is undergoing customer verification in fields such as LED, display panels, and compound semiconductors.

Advanced Detection for Semiconductor Processes
The WSD series is specifically designed for integrated circuit chips and general semiconductor processes such as SiC, OLED, and Micro LED. It provides high-precision optical wafer appearance defect detection, with detection accuracy reaching up to 100nm. It is compatible with 4–12 inch wafers and supports both bright-field and dark-field detection.
New Production Center to Drive Growth
On November 8th, Raintree Scientific Instruments Corporation held the launch ceremony for its new production center in Zhangjiang. The new center spans 4,000 square meters, with 2,000 square meters dedicated to Class 1,000 cleanroom facilities. It is expected to produce nearly 200 units annually. During the event, the company officially launched two new products: the TFX-R3 optical measurement equipment and the BriteSD300 optical defect detection device.

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