On September 19, JINGCE announced the successful delivery of its Micro-LED CT AOI testing equipment to a provincial laboratory client. This laboratory is the first provincial-level facility approved by the local provincial committee and government, established as an independent legal entity by a local 211 university.
Applications of Micro-LED CT AOI Testing Equipment
JINGCE’s self-developed wafer appearance inspection equipment is primarily used in semiconductor wafer factories, packaging and testing facilities, as well as for defect detection in Micro-LED and Mini-LED display wafers. The system employs a microscopic optical approach to inspect and measure micrometer-level surface defects on wafers. Additionally, it can be expanded to include 3D measurements for wafer bumping and LED applications.
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