Recently, Hefei Sineva completed the mass production delivery of its first Micro LED contact circuit open/short (referred to as “OS”) defect detection equipment to a leading company in the industry. This Micro LED OS testing device, developed specifically for the client, aims to enhance the production yield of new Micro LED display panels.
Importance of OS Detection in Micro LED Manufacturing
In the Micro LED display manufacturing process, it is crucial to ensure that each chip can be properly driven after transfer to avoid waste in chips, display materials, and equipment capacity. Therefore, detecting and repairing defective circuit lines on substrates prior to transfer is essential.
Features of the Micro LED OS Testing Equipment
Hefei Sineva’s newly delivered Micro LED OS testing equipment utilizes contact detection to rapidly locate circuit defects on the driver circuit substrates. It can simultaneously test up to 4,000 points without damaging the product, achieving a 100% short-circuit detection rate and over 99.5% open-circuit detection rate.
Additionally, the equipment employs high-precision micro-needles and fast alignment algorithms, allowing for seamless compatibility testing of products ranging from 6 to 22 inches. This not only ensures a high detection rate but also shortens the testing cycle significantly, enhancing testing efficiency, with single product testing time completed in under 55 seconds. When switching product types, the equipment can quickly and automatically adjust the testing process, improving production efficiency on the assembly line and meeting the demand for large-scale multi-category production of Micro LED display panels.
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